Conference proceeding
Partitioned n-detection test generation
Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.93-98
GLSVLSI '09
05/10/2009
DOI: 10.1145/1531542.1531566
Abstract
We describe a method for improving the quality of n-detection test sets. Unlike earlier methods for achieving the same goal, the proposed method is based on the conventional definition of the number of detections and uses a conventional n-detection test generation process. Under the proposed method, the set of target faults is partitioned into two or more subsets. n-detection test generation is carried out for each subset separately. The resulting test sets are combined into a single test set. Partitioning causes more faults to be targeted directly, and fewer faults to be dropped due to accidental detection. The fault subsets can be selected based on detection conditions of common defects. In this work we partition the set of faults into a subset that consists of all the stuck-at 0 faults, and a subset that consists of all the stuck-at 1 faults. We demonstrate through experimental results that for the same test set size, partitioning the set of faults improves the coverage of untargeted faults (non-feedback four-way bridging faults) compared to n-detection test generation for the unpartitioned set of faults.
Details
- Title: Subtitle
- Partitioned n-detection test generation
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.93-98
- Series
- GLSVLSI '09
- DOI
- 10.1145/1531542.1531566
- Publisher
- ACM
- Language
- English
- Date published
- 05/10/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197547802771
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