Conference proceeding
Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration
Proceedings of the conference on design, automation and test in europe, pp.583-589
DATE '98
02/23/1998
DOI: 10.1109/DATE.1998.655917
Abstract
We propose several compaction procedures for synchronous sequential circuits based on test vector restoration. Under a vector restoration procedure, all or most of the test vectors are first omitted from the test sequence. Test vectors are then restored one at a time or in subsequences only as necessary to restore the fault coverage of the original sequence. Techniques to speed-up the restoration process are investigated. These include limiting the test vectors initially omitted from the test sequence, consideration of several faults in parallel during restoration, and the use of a parallel fault simulator.
Details
- Title: Subtitle
- Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration
- Creators
- Ruifeng GuoIrith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, pp.583-589
- Publisher
- IEEE Computer Society
- Series
- DATE '98
- DOI
- 10.1109/DATE.1998.655917
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 02/23/1998
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197183702771
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