Properties of maximally dominating faults

Conference proceeding

Irith Pomeranz and Sudhakar M Reddy

13th Asian Test Symposium, pp.106-111

Asian Test Symposium, 13 (Kenting, Taiwan, 11/15/2004–11/17/2004)

2004

DOI: 10.1109/ATS.2004.70

View Online

Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: Properties of maximally dominating faults
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 13th Asian Test Symposium, pp.106-111
Conference: Asian Test Symposium, 13 (Kenting, Taiwan, 11/15/2004–11/17/2004)
DOI: 10.1109/ATS.2004.70
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE Computer Society
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197907602771

8 Record Views