Properties of output sequences and their use in guiding property-based test generation for synchronous sequential circuits

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/DELTA.2002.994654

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Conference proceeding

Properties of output sequences and their use in guiding property-based test generation for synchronous sequential circuits

Irith Pomeranz and Sudhakar M Reddy

Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.377-381

2002

DOI: 10.1109/DELTA.2002.994654

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Abstract

We show that output sequences produced by synchronous sequential circuits in response to test sequences that achieve high fault coverage have certain distinct properties. We demonstrate that these properties are useful as part of a property-based (simulation-based) test generation procedure. The importance of these properties is that they provide additional heuristics to drive property-based test generation, which to-date achieves the highest fault coverages reported for benchmark circuits. These additional heuristics are expected to improve the ability of property-based test generation procedures to achieve complete fault coverage in an efficient manner.

Genetics

Benchmark testing

Circuit faults

Circuit simulation

Circuit testing

Cities and towns

Logic testing

Sequential analysis

Sequential circuits

Synchronous generators

Details

Title: Subtitle: Properties of output sequences and their use in guiding property-based test generation for synchronous sequential circuits
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.377-381
DOI: 10.1109/DELTA.2002.994654
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197540902771

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