Pseudo random patterns using markov sources for scan BIST

Conference proceeding

Nadir Z Basturkmen, Sudhakar M Reddy and Irith Pomeranz

Proceedings - International Test Conference, pp.1013-1021

International Test Conference (ITC) (Baltimore, Maryland, USA, 10/10/2002)

2002

DOI: 10.1109/TEST.2002.1041857

View Online

Applied Sciences

Electronics

Exact sciences and technology

Microelectronic fabrication (materials and surfaces technology)

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: Pseudo random patterns using markov sources for scan BIST
Creators: Nadir Z Basturkmen - University of Iowa
Sudhakar M Reddy - University of Iowa
Irith Pomeranz - Purdue University West Lafayette
Resource Type: Conference proceeding
Publication Details: Proceedings - International Test Conference, pp.1013-1021
Conference: International Test Conference (ITC) (Baltimore, Maryland, USA, 10/10/2002)
Publisher: IEEE
DOI: 10.1109/TEST.2002.1041857
ISSN: 1089-3539
eISSN: 2378-2250
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198018002771

5 Record Views