Conference proceeding
Recovery during concurrent on-line testing of identical circuits
DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, pp.475-483
2005
DOI: 10.1109/DFTVS.2005.56
Abstract
We show that a concurrent on-line testing scheme based on output comparison of identical circuits can also identify situations where the circuit recovers from a permanent fault, i.e., functional operation can continue temporarily in spite of the presence of a fault. We show that the ability to recover from a fault is circuit-dependent, and that some circuits are better than others at allowing recovery. We also discuss the possibility of false recovery in the presence of multiple faulty and its implications.
Details
- Title: Subtitle
- Recovery during concurrent on-line testing of identical circuits
- Creators
- I Pomeranz - Purdue University West LafayetteS M Reddy
- Contributors
- C Metra (Editor)
- Resource Type
- Conference proceeding
- Publication Details
- DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, pp.475-483
- DOI
- 10.1109/DFTVS.2005.56
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984232097602771
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