Reducing the storage requirements of a test sequence by using a background vector

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/DATE.2010.5456996

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Conference proceeding

Reducing the storage requirements of a test sequence by using a background vector

Irith Pomeranz and Sudhakar M Reddy

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), pp.1237-1242

03/2010

DOI: 10.1109/DATE.2010.5456996

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Abstract

We describe a storage scheme for functional test sequences where a test sequence T is associated with a primary input vector B called a background vector. T is stored by storing only the differences between its test vectors and B. We describe a procedure for computing a background vector B for a given test sequence T. We also describe a procedure that modifies T so as to reduce its storage requirements with respect to B. We present experimental results demonstrating that the single background vector B, computed based on T, allows T to be modified such that a vast majority of its entries are equal to the corresponding entries of B. Consequently, storage of T reduces to storage of a small number of entries.

Circuit simulation

Circuit testing

Cities and towns

Compaction

Encoding

Genetic mutations

Manufacturing

Sequential analysis

Sequential circuits

Synchronous generators

Details

Title: Subtitle: Reducing the storage requirements of a test sequence by using a background vector
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), pp.1237-1242
Publisher: IEEE
DOI: 10.1109/DATE.2010.5456996
ISSN: 1530-1591
eISSN: 1558-1101
Language: English
Date published: 03/2010
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197442002771

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