Conference proceeding
Resource allocation and test scheduling for concurrent test of core-based SOC design
Proceedings 10th Asian Test Symposium, pp.265-270
2001
DOI: 10.1109/ATS.2001.990293
Abstract
A method to solve the resource allocation and test scheduling problems together in order to achieve concurrent test for core-based system-on-chip (SOC) designs is presented in this paper. The primary objective for concurrent SOC test is to reduce test application time. The methodology used in this paper is not limited to any specific test access mechanism (TAM). Additionally, it can also be applied for test budgeting during the design phase to obtain a tradeoff between test application time and SOC pins needed. In this paper, the above problem is formulated as a well-known 2-dimensional bin-packing problem. A best fit heuristic algorithm is employed to obtain satisfactory results.
Details
- Title: Subtitle
- Resource allocation and test scheduling for concurrent test of core-based SOC design
- Creators
- Yu Huang - University of IowaWu-Tung ChengChien-Chung TsaiNilanjan Mukherjee - Mentor GraphicsOmer Samman - Mentor GraphicsYahya Zaidan - Mentor GraphicsSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings 10th Asian Test Symposium, pp.265-270
- DOI
- 10.1109/ATS.2001.990293
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 2001
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197308502771
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