Scan BIST targeting transition faults using a Markov source

Hangkyu Lee; Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/ISQED.2004.1283722

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Conference proceeding

Scan BIST targeting transition faults using a Markov source

Hangkyu Lee, Irith Pomeranz and Sudhakar M Reddy

International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720), pp.497-502

2004

DOI: 10.1109/ISQED.2004.1283722

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Abstract

We propose a new scan BIST method for transition faults. The method uses a Markov source for test pattern generation. We develop this method for skewed-load testing as well as for broadside testing. In the design of a Markov source for transition faults, we first use statistics of deterministic tests for stuck-at faults. Then, we propose a new method for identifying subsets of stuck-at tests whose statistics are useful in detecting hard-to-detect transition faults. Finally, by using statistics of tests for transition faults, we detect all the remaining detectable transition faults. The method reported achieves complete coverage of detectable transition faults in benchmark circuits using a limited number of pseudo-random tests.

Probability

Automatic testing

Built-in self-test

Circuit faults

Circuit testing

Electrical fault detection

Fault detection

Integrated circuit testing

Statistical analysis

Test pattern generators

Details

Title: Subtitle: Scan BIST targeting transition faults using a Markov source
Creators: Hangkyu Lee - Purdue University West Lafayette
Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720), pp.497-502
DOI: 10.1109/ISQED.2004.1283722
Publisher: IEEE
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197205702771

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