Conference proceeding
Scan-Based Delay Fault Tests for Diagnosis of Transition Faults
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.419-427
10/2006
DOI: 10.1109/DFT.2006.56
Abstract
This paper studies the effect of the type of scan-based delay fault tests used for a circuit on the ability to diagnose delay defects by studying its effect on diagnosis of transition faults. The authors consider enhanced scan tests, skewed-load tests, broadside tests, functional broadside tests, and a combination of skewed-load and broadside tests. The results indicate that while functional broadside tests should be used for fault detection to avoid overtesting, the test set should be extended for fault diagnosis by adding other types of tests. Adding a small number of skewed-load tests is especially useful for diagnosis if enhanced scan is not available
Details
- Title: Subtitle
- Scan-Based Delay Fault Tests for Diagnosis of Transition Faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.419-427
- DOI
- 10.1109/DFT.2006.56
- ISSN
- 1550-5774
- eISSN
- 2377-7966
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197115902771
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