Conference proceeding
Selection of a fault model for fault diagnosis based on unique responses
Proceedings of the Conference on design, automation and test in europe, pp.994-999
DATE '09
04/20/2009
DOI: 10.1109/DATE.2009.5090809
Abstract
We describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selected. This step allows fault diagnosis to be performed based on a single fault model after identifying the most appropriate one. We describe a specific implementation of this preprocessing step based on what is referred to as the unique output response of a fault model. As an example, we apply it to the diagnosis of multiple stuck-at faults, selecting between single and double stuck-at faults as the fault model for diagnosis. Experimental results demonstrate improvements compared to diagnosis based on single stuck-at faults, and compared to diagnosis based on both single and double stuck-at faults.
Details
- Title: Subtitle
- Selection of a fault model for fault diagnosis based on unique responses
- Creators
- Irith PomeranzSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the Conference on design, automation and test in europe, pp.994-999
- Publisher
- European Design and Automation Association
- Series
- DATE '09
- DOI
- 10.1109/DATE.2009.5090809
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 04/20/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197064802771
Metrics
7 Record Views