Conference proceeding
Session Summary III: Power-Aware Testing: Present and Future
2012 IEEE 21st Asian Test Symposium, pp.220-220
Asian Test Symposium, 21 (Niigata, Japan, 11/19/2012 - 11/22/2012)
11/2012
DOI: 10.1109/ATS.2012.86
Abstract
Summary form only given, as follows. Power-aware testing is facing more and more challenges in terms of test power analysis as well as test power management due to the ever-growing gap between functional power and test power for low-power LSI circuits. This special session, presented by top experts from both academia and industry, will provide firsthand information on state-of-the-art solutions as well as insightful perspectives on future R&D directions about power-aware testing. It will help researchers and practitioners alike in advancing poweraware test technologies for low-power LSI circuits, the enabler of all energy-smart electronic devices that are now indispensable in our everyday life.
Details
- Title: Subtitle
- Session Summary III: Power-Aware Testing: Present and Future
- Creators
- Xiaoging WenSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2012 IEEE 21st Asian Test Symposium, pp.220-220
- Conference
- Asian Test Symposium, 21 (Niigata, Japan, 11/19/2012 - 11/22/2012)
- Publisher
- IEEE
- DOI
- 10.1109/ATS.2012.86
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Language
- English
- Date published
- 11/2012
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198006202771
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