Solving maximum-entropy sampling problems using factored masks

Conference proceeding

Peer reviewed

Samuel Burer and Jon Lee

Mathematical programming, Vol.109(2-3), pp.263-281

Large-scale nonlinear and semidefinite programming

03/01/2007

DOI: 10.1007/s10107-006-0024-1

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Applied sciences

Exact sciences and technology

Flows in networks. Combinatorial problems

Mathematical programming

Operational research and scientific management

Operational research. Management science

Title: Subtitle: Solving maximum-entropy sampling problems using factored masks
Creators: Samuel Burer - University of Iowa
Jon Lee - IBM
Resource Type: Conference proceeding
Publication Details: Mathematical programming, Vol.109(2-3), pp.263-281
Conference: Large-scale nonlinear and semidefinite programming
Publisher: Springer
DOI: 10.1007/s10107-006-0024-1
ISSN: 0025-5610
eISSN: 1436-4646
Language: English
Date published: 03/01/2007
Academic Unit: Business Analytics
Record Identifier: 9984380457702771

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