Conference proceeding
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary
25th IEEE VLSI Test Symposium (VTS'07), pp.225-230
05/2007
DOI: 10.1109/VTS.2007.75
Abstract
In this paper we present a new technique to speed up the effect-cause defect diagnosis by using a dictionary of very small size. In the proposed method, a dictionary of small size is used to reduce the number of events (gate evaluations) during the simulation of failing patterns and also a procedure to select a subset of passing patterns for simulation. Although the dictionary size is smaller, experimental results show speed up of effect-cause diagnosis by up to 156times. Experimental results from industrial designs validate the effectiveness of the proposed method.
Details
- Title: Subtitle
- Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary
- Creators
- Wei Zou - Mentor GraphicsWu-Tung Cheng - Mentor GraphicsS.M Reddy - University of IowaHuaxing Tang - Mentor Graphics
- Resource Type
- Conference proceeding
- Publication Details
- 25th IEEE VLSI Test Symposium (VTS'07), pp.225-230
- DOI
- 10.1109/VTS.2007.75
- ISSN
- 1093-0167
- eISSN
- 2375-1053
- Publisher
- IEEE
- Language
- English
- Date published
- 05/2007
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197450102771
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