Conference proceeding
State persistence: a property for guiding test generation
Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.523-528
GLSVLSI '09
05/10/2009
DOI: 10.1145/1531542.1531660
Abstract
We study a property of circuit states referred to as persistence. The persistence pi(s) of a state s is the number of next-state variables whose values are specified (0 or 1) when a fully-unspecified primary input vector is applied to the circuit in state s. When a next-state variable Yi is specified under a fully-unspecified primary input vector, there are faults in the input cone of Yi that cannot be detected on Yi. We demonstrate through experimental results that when lower-persistence states are used as scan-in states, the resulting tests detect larger numbers of faults. Low-persistence states are thus preferable as scan-in states during test generation. We also discuss the computation of low-persistence states.
Details
- Title: Subtitle
- State persistence: a property for guiding test generation
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.523-528
- Series
- GLSVLSI '09
- DOI
- 10.1145/1531542.1531660
- Publisher
- ACM
- Language
- English
- Date published
- 05/10/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197554202771
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