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Statistical diagnosis for intermittent scan chain hold-time fault
Conference proceeding

Statistical diagnosis for intermittent scan chain hold-time fault

Yu Huang, Wu-Tung Cheng, S.M Reddy, Cheng-Ju Hsieh and Yu-Ting Hung
International Test Conference, 2003. Proceedings. ITC 2003, Vol.1, pp.319-328
International Test Conference (ITC) (Charlotte, North Carolina, 09/30/2003 - 10/09/2003)
2003
DOI: 10.1109/TEST.2003.1270854

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Abstract

Probability Crosstalk Delay Electrons Fault diagnosis Semiconductor device noise Semiconductor process modeling Signal design Timing Wire

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