Stuck-at tuple-detection: A fault model based on stuck-at faults for improved defect coverage

I Pomeranz; S M Reddy; IEEE COMP SOC

doi:10.1109/VTEST.1998.670882

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Conference proceeding

Stuck-at tuple-detection: A fault model based on stuck-at faults for improved defect coverage

I Pomeranz, S M Reddy and IEEE COMP SOC

16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.289-294

1998

DOI: 10.1109/VTEST.1998.670882

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Abstract

N-detection stuck-at test sets were shown to be effective in achieving high defect coverages for benchmark circuits. However, the definition of n-detection test sets allows the same set of faults to be detected by several different tests, thus potentially detecting the same defects. We propose an extension of the n-detection model that alleviates this problem by considering m-tuples of faults and requiring that different tests would detect different m-tuples. We present experimental results to support this model.

Details

Title: Subtitle: Stuck-at tuple-detection: A fault model based on stuck-at faults for improved defect coverage
Creators: I Pomeranz - University of Iowa
S M Reddy
IEEE COMP SOC
Resource Type: Conference proceeding
Publication Details: 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.289-294
DOI: 10.1109/VTEST.1998.670882
Language: English
Date published: 1998
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984231871302771

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