Conference proceeding
SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034), pp.606-615
International Test Conference (ITC) (Atlantic City, New Jersey, USA, 09/30/1999)
1999
DOI: 10.1109/TEST.1999.805785
Abstract
This paper presents a technique and tool (SymSim) for symbolic fault-simulation of data-paths specified at the Register-Transfer Level (RTL) constrained by specific control sequences. SymSim achieves this using a symbolic value system suitable for RTL simulation. It also computes and maintains input dependency information at each node in the design using a novel artifact called Dependency Set which at any time-frame contains all primary input symbols that effect the current value on that node. Symbolic fault-simulation can be used along with a symbolic test-generator to detect multiple faults with a single test to reduce test length and and generation time.
Details
- Title: Subtitle
- SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level
- Creators
- S Yadavalli - IntelS.M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034), pp.606-615
- Conference
- International Test Conference (ITC) (Atlantic City, New Jersey, USA, 09/30/1999)
- Publisher
- IEEE
- DOI
- 10.1109/TEST.1999.805785
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Language
- English
- Date published
- 1999
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197914702771
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