TEMPLATES: a test generation procedure for synchronous sequential circuits

I Pomeranz; S.M Reddy

doi:10.1109/ATS.1997.643923

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Conference proceeding

TEMPLATES: a test generation procedure for synchronous sequential circuits

I Pomeranz and S.M Reddy

Proceedings Sixth Asian Test Symposium (ATS'97), pp.74-79

1997

DOI: 10.1109/ATS.1997.643923

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Abstract

We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have "similar" test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation.

Circuit faults

Circuit testing

Cities and towns

Electrical fault detection

Fault detection

Sequential analysis

Sequential circuits

Synchronous generators

Details

Title: Subtitle: TEMPLATES: a test generation procedure for synchronous sequential circuits
Creators: I Pomeranz - University of Iowa
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings Sixth Asian Test Symposium (ATS'97), pp.74-79
Publisher: IEEE
DOI: 10.1109/ATS.1997.643923
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 1997
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197207502771

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