Test Data Compression Based on Output Dependence

Conference proceeding

Irith Pomeranz and Sudhakar Reddy

Proceedings of the conference on design, automation and test in europe, Vol.1, pp.11186-1187

DATE '03

03/03/2003

DOI: 10.1109/DATE.2003.1253793

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Title: Subtitle: Test Data Compression Based on Output Dependence
Creators: Irith Pomeranz
Sudhakar Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings of the conference on design, automation and test in europe, Vol.1, pp.11186-1187
Publisher: IEEE Computer Society
Series: DATE '03
DOI: 10.1109/DATE.2003.1253793
ISSN: 1530-1591
eISSN: 1558-1101
Language: English
Date published: 03/03/2003
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197346402771

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