Conference proceeding
Test compaction for synchronous sequential circuits by test sequence recycling
Proceedings of the 8th Great Lakes Symposium on VLSI (Cat. No.98TB100222), pp.216-221
Great Lakes Symposium on VLSI, 8 (Lafayette, LA, USA, 02/21/1998)
1998
DOI: 10.1109/GLSV.1998.665229
Abstract
We introduce a new concept for test sequence compaction referred to as recycling. Recycling is based on the observation that easy-to-detect faults tend to be detected several times by a deterministic test sequence, whereas hard-to-detect faults are detected once towards the end of the test sequence. Thus, the suffix of a test sequence detects a large number of faults, including hard-to-detect faults. The recycling operation keeps a suffix S/sub 1/ of a test sequence T/sub 1/ and discards the rest of the sequence. The suffix S/sub 1/ is then used as a prefix of a new test sequence T/sub 2/. In this process, S/sub 1/ is expected to detect the more difficult to detect faults as well as many of the easy-to-detect faults, resulting in a new sequence T/sub 2/ which is shorter than T/sub 1/. Recycling is enhanced by a scheme where several faults are targeted simultaneously to generate the shortest possible test sequence that detects all of them.
Details
- Title: Subtitle
- Test compaction for synchronous sequential circuits by test sequence recycling
- Creators
- I Pomeranz - University of IowaS.M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 8th Great Lakes Symposium on VLSI (Cat. No.98TB100222), pp.216-221
- Conference
- Great Lakes Symposium on VLSI, 8 (Lafayette, LA, USA, 02/21/1998)
- Publisher
- IEEE
- DOI
- 10.1109/GLSV.1998.665229
- ISSN
- 1066-1395
- Language
- English
- Date published
- 1998
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197913502771
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