Conference proceeding
Test compaction for transition faults under transparent-scan
Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe: Proceedings; 06-10 Mar. 2006, pp.1264-1269
Design Automation & Test in Europe Conference (Munich, Germany, 03/06/2006–03/10/2006)
03/01/2006
DOI: 10.1109/DATE.2006.244098
Abstract
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application time for stuck-at faults. We show that similar advantages exist when considering transition faults. We first show that a test sequence under the transparent-scan approach can imitate the application of broadside tests for transition faults. Test compaction can proceed similar to stuck-at faults by omitting test vectors from the test sequence. A new approach for enhancing test compaction is also described, whereby additional broadside tests are embedded in the transparent-scan sequence without increasing its length or reducing its fault coverage.
Details
- Title: Subtitle
- Test compaction for transition faults under transparent-scan
- Creators
- Irith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe: Proceedings; 06-10 Mar. 2006, pp.1264-1269
- Conference
- Design Automation & Test in Europe Conference (Munich, Germany, 03/06/2006–03/10/2006)
- DOI
- 10.1109/DATE.2006.244098
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 03/01/2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198000402771
Metrics
51 Record Views