Test data compression using don't-care identification and statistical encoding [logic testing]

Seiji Kajihara; Kenjiro Taniguchi; Kohei Miyase; Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/ATS.2002.1181687

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Conference proceeding

Test data compression using don't-care identification and statistical encoding [logic testing]

Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz and Sudhakar M Reddy

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02), Vol.2002-, pp.67-72

2002

DOI: 10.1109/ATS.2002.1181687

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Abstract

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.

Data Compression

Microelectronics

Benchmark testing

Circuit faults

Circuit testing

Encoding

Logic testing

Random number generation

System testing

Test data compression

Details

Title: Subtitle: Test data compression using don't-care identification and statistical encoding [logic testing]
Creators: Seiji Kajihara - Kyushu Institute of Technology
Kenjiro Taniguchi - Kyushu Institute of Technology
Kohei Miyase - Kyushu Institute of Technology
Irith Pomeranz
Sudhakar M Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02), Vol.2002-, pp.67-72
DOI: 10.1109/ATS.2002.1181687
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197214302771

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