Test data compression using don't-care identification and statistical encoding

Seiji Kajihara; Kenjiro Taniguchi; Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/DELTA.2002.994661

Back

Conference proceeding

Test data compression using don't-care identification and statistical encoding

Seiji Kajihara, Kenjiro Taniguchi, Irith Pomeranz and Sudhakar M Reddy

Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.413-416

2002

DOI: 10.1109/DELTA.2002.994661

View Online

Abstract

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets.

Benchmark testing

Binary codes

Circuit faults

Circuit testing

Data engineering

Electronic equipment testing

Encoding

Logic testing

System testing

Test data compression

Details

Title: Subtitle: Test data compression using don't-care identification and statistical encoding
Creators: Seiji Kajihara - Kyushu Institute of Technology
Kenjiro Taniguchi
Irith Pomeranz
Sudhakar M Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.413-416
DOI: 10.1109/DELTA.2002.994661
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197540702771

Metrics

7 Record Views

7 Times Cited - Web of Science