Conference proceeding
Test generation for synchronous sequential circuits using multiple observation times
[1991] Digest of Papers. Fault-Tolerant Computing: The Twenty-First International Symposium, pp.52-59
Fault-Tolerant Computing, 21 (Montreal, Quebec, Canada, 06/25/1991 - 06/27/1991)
1991
DOI: 10.1109/FTCS.1991.146632
Abstract
The test generation problem for synchronous sequential circuits is considered in the case where hardware reset is not available. The observations which form the motivation for the work are given. On the basis of the observations, the use of multiple fault free responses as well as multiple time units for fault detection is suggested. Application to gate level synchronous sequential circuits is then considered. Experimental results are given to support the claim that a small number of observation times is required, and that a small number of fault free responses need be stored for every fault. 100% fault efficiency is achieved.< >
Details
- Title: Subtitle
- Test generation for synchronous sequential circuits using multiple observation times
- Creators
- I Pomeranz - Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USAS.M Reddy - Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
- Resource Type
- Conference proceeding
- Publication Details
- [1991] Digest of Papers. Fault-Tolerant Computing: The Twenty-First International Symposium, pp.52-59
- Conference
- Fault-Tolerant Computing, 21 (Montreal, Quebec, Canada, 06/25/1991 - 06/27/1991)
- Publisher
- IEEE Comput. Soc. Press
- DOI
- 10.1109/FTCS.1991.146632
- ISSN
- 0731-3071
- eISSN
- 2375-124X
- Language
- English
- Date published
- 1991
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198011102771
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