Test-point insertion to enhance test compaction for scan designs

Conference proceeding

Irith Pomeranz and Sudhakar M Reddy

Proceeding International Conference on Dependable Systems and Networks. DSN 2000, pp.375-381

DSN 2000 : international conference on dependable systems and networks (New york NY, 25-28 June 2000 )

2000

DOI: 10.1109/ICDSN.2000.857564

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Applied sciences

Computer science; control theory; systems

Computer systems performance. Reliability

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Integrated circuits

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Software

Title: Subtitle: Test-point insertion to enhance test compaction for scan designs
Creators: Irith Pomeranz - University of Iowa
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceeding International Conference on Dependable Systems and Networks. DSN 2000, pp.375-381
Conference: DSN 2000 : international conference on dependable systems and networks (New york NY, 25-28 June 2000 )
Publisher: IEEE Computer Society
DOI: 10.1109/ICDSN.2000.857564
Language: English
Date published: 2000
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197195702771

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