Conference proceeding
Testing delay faults in embedded CAMs
2003 Test Symposium, Vol.2003-, pp.378-383
2003
DOI: 10.1109/ATS.2003.1250841
Abstract
Critical paths are analyzed in a CAM and minimum test patterns are proposed to detect delay faults in a CAM. The test patterns derived are shown to be covered by the basic algorithm proposed earlier in (G. Giles et al, Proc. Int. Test Conf. p.471-474, 1985).
Details
- Title: Subtitle
- Testing delay faults in embedded CAMs
- Creators
- Xiaogang Du - University of IowaSudhakar M Reddy - University of IowaJoseph RayhawkWu-Tung Cheng
- Resource Type
- Conference proceeding
- Publication Details
- 2003 Test Symposium, Vol.2003-, pp.378-383
- Publisher
- IEEE
- DOI
- 10.1109/ATS.2003.1250841
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Language
- English
- Date published
- 2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197339102771
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