Conference proceeding
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
Proceedings of the conference on design, automation and test in europe, Vol.2, pp.1008-1013
DATE '05
03/07/2005
DOI: 10.1109/DATE.2005.306
Abstract
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI (f) with every circuit fault f. The heuristic estimates the number of faults that will be detected by a test generated for f. Fault ordering is done such that a fault with a higher accidental detection index appears earlier in the ordered fault set and targeted earlier during test generation. This order is effective for generating compact test sets, and for obtaining a test set with a steep fault coverage curve. Such a test set has several applications. We present experimental results to demonstrate the effectiveness of the heuristic.
Details
- Title: Subtitle
- The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, Vol.2, pp.1008-1013
- Series
- DATE '05
- DOI
- 10.1109/DATE.2005.306
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Publisher
- IEEE Computer Society
- Language
- English
- Date published
- 03/07/2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197539102771
Metrics
17 Record Views