The effects of test compaction on fault diagnosis

Y Shao; R Guo; I Pomeranz; S.M Reddy

doi:10.1109/TEST.1999.805842

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Conference proceeding

The effects of test compaction on fault diagnosis

Y Shao, R Guo, I Pomeranz and S.M Reddy

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034), pp.1083-1089

International Test Conference (ITC) (Atlantic City, New Jersey, USA, 09/30/1999)

1999

DOI: 10.1109/TEST.1999.805842

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Abstract

The effect of test compaction on fault diagnosis is experimentally investigated. Results for combinational and sequential circuits indicate that the diagnostic resolution achieved by compacted tests is only minimally lower than that for uncompacted tests. Furthermore, the diagnostic resolution of the compacted tests can be enhanced to be the same or better than that for the uncompacted rests while still retaining compactness.

Circuit faults

Circuit testing

Cities and towns

Combinational circuits

Compaction

Electrical fault detection

Fault detection

Fault diagnosis

Sequential analysis

Sequential circuits

Details

Title: Subtitle: The effects of test compaction on fault diagnosis
Creators: Y Shao - University of Iowa
R Guo - University of Iowa
I Pomeranz - University of Iowa
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034), pp.1083-1089
Conference: International Test Conference (ITC) (Atlantic City, New Jersey, USA, 09/30/1999)
Publisher: IEEE
DOI: 10.1109/TEST.1999.805842
ISSN: 1089-3539
eISSN: 2378-2250
Language: English
Date published: 1999
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197913602771

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