Conference proceeding
The role of adhesion forces in nanoscale measurements of the conductive properties of organic surfaces using conductive probe AFM
Proceedings of SPIE, Vol.5513(1), pp.14-21
Physical Chemistry of Interfaces and Nanomaterials III
10/14/2004
DOI: 10.1117/12.559718
Abstract
Electronic and mechanical studies of metal-molecules-metal junction have been accomplished to evaluate how bias-induced adhesion forces influence the charge transport efficiency of these junctions. The conducting probe atomic force microscope (CP-AFM) measures the current through an organic film sandwiched between two metal electrodes as a function of the tip-sample separation simultaneously with detection of the force between the probe and the surface. By applying a voltage between the sample and the tip, an attractive electrostatic capacitance force is added to the adhesion force. This paper describes probe-sample capacitance forces in conducting probe (CP) microscopy of polythiophene and alkanethiol monolayers, both theoretically and experimentally. The importance of taking into account an offset in the interaction force determined by the bias-induced adhesion force in the electronic measurements is demonstrated using current-voltage (I-V) characteristics of the polythiophene monolayer and the dependence of the adhesion force as a function of applied tip bias.
Details
- Title: Subtitle
- The role of adhesion forces in nanoscale measurements of the conductive properties of organic surfaces using conductive probe AFM
- Creators
- Alexei V Tivanski - Univ. of Pittsburgh (USA)Gilbert C Walker - Univ. of Pittsburgh (USA)
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of SPIE, Vol.5513(1), pp.14-21
- Conference
- Physical Chemistry of Interfaces and Nanomaterials III
- DOI
- 10.1117/12.559718
- ISSN
- 0277-786X
- Language
- English
- Date published
- 10/14/2004
- Academic Unit
- Chemistry
- Record Identifier
- 9984216725702771
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