Conference proceeding
Theory and practice of sequential machine testing and testability
FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing, pp.330-337
International Symposium on Fault-Tolerant Computing, 23 (Toulouse, France, 06/22/1993 - 06/24/1993)
1993
DOI: 10.1109/FTCS.1993.627336
Abstract
Undetectable and redundant faults in synchronous sequential circuits have recently received wide attention. Previous classifications of detectable, undetectable and redundant faults in such circuits assume certain restrictions regarding the operation of the circuit-under-test. In this work, no restrictions are imposed, and faults are classified on the basis of the existence (or lack) of an input/output experiment that distinguishes the fault free and faulty circuits. It is shown that faults that were previously considered redundant are detectable according to the new definitions (detectable in a probabilistic sense). The practical usefulness of the fault classification presented is discussed.
Details
- Title: Subtitle
- Theory and practice of sequential machine testing and testability
- Creators
- I Pomeranz - University of IowaS.M Reddy - University of IowaJ.H Patel - University of Illinois at Urbana–Champaign
- Resource Type
- Conference proceeding
- Publication Details
- FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing, pp.330-337
- Conference
- International Symposium on Fault-Tolerant Computing, 23 (Toulouse, France, 06/22/1993 - 06/24/1993)
- Publisher
- IEEE
- DOI
- 10.1109/FTCS.1993.627336
- ISSN
- 0731-3071
- eISSN
- 2375-124X
- Language
- English
- Date published
- 1993
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198010902771
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