Conference proceeding
Tuple detection for path delay faults: a method for improving test set quality
18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design, pp.41-46
International Conference on VLSI Design, 18 (Kolkata, India, 01/03/2005–01/07/2005)
2005
DOI: 10.1109/ICVD.2005.165
Abstract
To improve the quality of test sets for path delay faults, we describe a variation of n-detection test generation based on the concept of m-tuple detection. An m-tuple test set for a set of path delay faults P includes a test for every m-tuple of faults defined over P. Such a test set has the following advantages. (1) Similar to an n-detection test set, it results in several tests for every path delay fault p /spl isin/ P, increasing the likelihood of testing p under worst-case delay conditions. (2) It increases the likelihood of accidentally detecting nontarget path delay faults, which are not included in P, more effectively than a conventional n-detection test set. Experimental results demonstrate that m-tuple test generation for m = 2 is manageable in terms of test set size and run time increase relative to conventional test generation.
Details
- Title: Subtitle
- Tuple detection for path delay faults: a method for improving test set quality
- Creators
- I Pomeranz - Purdue University West LafayetteS.M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design, pp.41-46
- Conference
- International Conference on VLSI Design, 18 (Kolkata, India, 01/03/2005–01/07/2005)
- DOI
- 10.1109/ICVD.2005.165
- ISSN
- 1063-9667
- eISSN
- 2380-6923
- Publisher
- IEEE
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198013002771
Metrics
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