Weighted pseudo-random BIST for N-detection of single stuck-at faults

Conference proceeding

CHAOWEN YU, Sudhakar M Reddy and Irith Pomeranz

13th Asian Test Symposium, pp.178-183

Asian Test SYmposium, 13 (Kenting, Taiwan, 11/15/2004–11/17/2004)

2004

DOI: 10.1109/ATS.2004.89

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: Weighted pseudo-random BIST for N-detection of single stuck-at faults
Creators: CHAOWEN YU - University of Iowa
Sudhakar M Reddy - University of Iowa
Irith Pomeranz - Purdue University West Lafayette
Resource Type: Conference proceeding
Publication Details: 13th Asian Test Symposium, pp.178-183
Conference: Asian Test SYmposium, 13 (Kenting, Taiwan, 11/15/2004–11/17/2004)
DOI: 10.1109/ATS.2004.89
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE Computer Society
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197918202771

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