Conference proceeding
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Proceedings of the conference on design, automation and test in europe, Vol.1, pp.444-449
DATE '05
03/07/2005
DOI: 10.1109/DATE.2005.330
Abstract
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform both a worst-case analysis and an average-case analysis to check the effect of restricting n on the unmodeled fault coverage of an (arbitrary) n-detection test set. Our analysis is independent of any particular test set or test generation approach. It is based on a specific set of target faults and a specific set of untargeted faults. It shows that, depending on the circuit, very large values of n may be needed to guarantee the detection of all the untargeted faults. We discuss the implications of these results.
Details
- Title: Subtitle
- Worst-Case and Average-Case Analysis of n-Detection Test Sets
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, Vol.1, pp.444-449
- Series
- DATE '05
- DOI
- 10.1109/DATE.2005.330
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Publisher
- IEEE Computer Society
- Language
- English
- Date published
- 03/07/2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197439302771
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