Conference proceeding
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe - Volume 1; 16-20 Feb. 2004
Design, Automation & Test in Europe Conference in Exhibition (Paris, France, 02/16/2004–02/20/2004)
02/16/2004
DOI: 10.1109/DATE.2004.1268829
Abstract
We define the concepts of z-sets and z-detections for combinational circuits (or the combinational logic of scan circuits). Based on these concepts we define structural characteristics and characteristics based on fault simulation. We show that these characteristics determine the numbers of fault pairs that are guaranteed to be distinguished by a given fault detection test set. These fault pairs do not need to be considered during diagnostic fault simulation or test generation. We demonstrate that benchmark circuits as well as industrial circuits have these characteristics to a larger extent than may be expected. As a result, only small percentages of fault pairs need to be considered during diagnostic fault simulation or test generation once a fault detection test set is available. In addition, these fault pairs can be identified efficiently.
Details
- Title: Subtitle
- Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
- Creators
- Irith PomeranzSrikanth VenkataramanSudhakar M ReddyBharath Seshadri
- Resource Type
- Conference proceeding
- Publication Details
- Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe - Volume 1; 16-20 Feb. 2004
- Conference
- Design, Automation & Test in Europe Conference in Exhibition (Paris, France, 02/16/2004–02/20/2004)
- DOI
- 10.1109/DATE.2004.1268829
- ISSN
- 1530-1591
- Publisher
- IEEE
- Language
- English
- Date published
- 02/16/2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198012702771
Metrics
15 Record Views