Characterizing thin-film adjustable X-ray optics using optical interferometry

X-ray emitting sources such as black holes, hot plasma surrounding galaxies, and the atmospheres of stars are fundamental to studying the physical processes that govern our universe. More specifically, the observation of early forming black holes are of particular interest to understand the mechanisms that drive galaxy growth and evolution. These seed black holes, however, are some of the farthest and faintest X-ray sources and thus require space-based observatories with exquisite optics in order to both detect them and distinguish them from their host galaxies. Thus, future observatories will require thin reflective mirrors to form a large collecting area and be precisely shaped to focus incoming X-rays. Fabricating such mirrors has historically been a technical challenge given that thin mirrors deform easily, degrading their performance. One solution has been to develop adjustable X-ray optics (AXROs). AXROs are mirrors that, when supplied a low voltage, experience a strain that locally changes the figure of the mirror. By studying the responses of these actuators, they can be controlled to correct the deformation caused by fabricating and mounting thin mirrors. Thus, the primary goal of this thesis is to mature the readiness of AXROs for use in astronomy as well as synchrotron facilities which use X-ray beamlines to study the structure of materials. Optical interferometry is a technique that allows the surface shape of optics to be measured with great precision. This work reports on the application of optical interferometry to characterize the actuator performance of several AXROs which vary in size, shape, film material, and are intended for use both in astronomy and synchrotron facilities. The data gathered from measuring actuator responses were used to characterize the AXROs correctability at improving their shape and angular resolution.