Cross section measurement of simultaneously produced Υ(1S) + J/Ψ mesons and upgrade studies for the CMS detector
Abstract
Details
- Title: Subtitle
- Cross section measurement of simultaneously produced Υ(1S) + J/Ψ mesons and upgrade studies for the CMS detector
- Creators
- Kamuran Dilsiz - University of Iowa
- Contributors
- Jane M. Nachtman (Advisor)Yasar Onel (Committee Member)Robert L. Merlino (Committee Member)Mary Hall Reno (Committee Member)Kai Yi (Committee Member)
- Resource Type
- Dissertation
- Degree Awarded
- Doctor of Philosophy (PhD), University of Iowa
- Degree in
- Physics
- Date degree season
- Spring 2016
- DOI
- 10.17077/etd.9cuqotr7
- Publisher
- University of Iowa
- Number of pages
- xiv, 129 pages
- Copyright
- Copyright © 2016 Kamuran Dilsiz
- Language
- English
- Description illustrations
- color illustrations
- Description bibliographic
- Includes bibliographical references (pages 125-129).
- Public Abstract (ETD)
A measured cross section of simultaneously produced Υ(1S) and J/ψ mesons is performed using 20 fb-1 integrated luminosity in proton-proton collisions at √s=8 TeV center of mass energy recorded by the CMS detector. Both mesons are fully reconstructed from their final states, μ+ μ-. To extract the signal yield, an extended maximum likelihood fit is used on two (invariant mass of Υ(1S) and J/ψ ) dimensional components. The cross section in the fiducial region, defined as |y|<2.0, is determined to be 16.5±3.6(stat)±2.6(syst) pb. The silicon pixel detector is close to the interaction point of the CMS detector, so it is exposed to a very harsh radiation environment. The silicon sensors of the pixel detector need to be replaced from time to time because of radiation damage. For the next interaction, a silicon sensor must resist an integrated luminosity of 300 fb-1. The silicon wafers that were made by Sintef were tested to check the capability of the sensors to be used for Phase I upgrade. Due to increasing integrated luminosity at particle accelerators, radiation hard detectors are needed. Secondary Emission Ionization Calorimetry is a new technique for high radiation conditions. The purpose is to design an SE module from a conventional PMT mode for secondary emission ionization calorimetry.
- Academic Unit
- Physics and Astronomy
- Record Identifier
- 9983776898802771