- Title: Subtitle
- Functional and pattern sensitive fault testing algorithms for semiconductor random access memories
- Creators
- Dong Sung Suk - University of Iowa
- Resource Type
- Dissertation
- Degree Awarded
- Doctor of Philosophy (PhD), University of Iowa
- Degree in
- Engineering
- Publisher
- University of Iowa
- Number of pages
- v, 89 leaves
- Copyright
- No known copyright restrictions
- Comment
This PDF was created as part of a mass digitization project. If you encounter image quality issues affecting usability, please contact lib-digitization@uiowa.edu.
- Language
- English
- Academic Unit
- Thesis and Dissertation Archive
- Record Identifier
- 9985152912802771
Dissertation
Functional and pattern sensitive fault testing algorithms for semiconductor random access memories
University of Iowa
Doctor of Philosophy (PhD), University of Iowa
1978
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