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Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy
Dissertation   Open access

Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy

R-A- Thilini Perera Rupasinghe
University of Iowa
Doctor of Philosophy (PhD), University of Iowa
Autumn 2015
DOI: 10.17077/etd.zuj1apg8
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Abstract

Atomic Force Microscopy Chemistry Conductive Probe AFM Nanoindentation Nanomaterials

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