Edited book
Computational Pathology and Ophthalmic Medical Image Analysis: First International Workshop, COMPAY 2018, and 5th International Workshop, OMIA 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16 - 20, 2018, Proceedings
Lecture notes in computer science, Vol.11039
Springer International Publishing
2018
DOI: 10.1007/978-3-030-00949-6
Abstract
This book constitutes the refereed joint proceedings of the First International Workshop on Computational Pathology, COMPAY 2018, and the 5th International Workshop on Ophthalmic Medical Image Analysis, OMIA 2018, held in conjunction with the 21st International Conference on Medical Imaging and Computer-Assisted Intervention, MICCAI 2018, in Granada, Spain, in September 2018. The 19 full papers (out of 25 submissions) presented at COMPAY 2018 and the 21 full papers (out of 31 submissions) presented at OMIA 2018 were carefully reviewed and selected. The COMPAY papers focus on artificial intelligence and deep learning. The OMIA papers cover various topics in the field of ophthalmic image analysis.
Details
- Title: Subtitle
- Computational Pathology and Ophthalmic Medical Image Analysis: First International Workshop, COMPAY 2018, and 5th International Workshop, OMIA 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16 - 20, 2018, Proceedings
- Creators
- Danail StoyanovZeike TaylorFrancesco Ciompi - Radboud University NijmegenYanwu XuAnne MartelLena Maier-HeinNasir Rajpoot - University of WarwickJeroen van der Laak - Radboud University NijmegenMitko Veta - Eindhoven University of TechnologyStephen McKenna - ComputingDavid Snead - University Hospitals Coventry and Warwickshire NHS TrustEmanuele TruccoMona K GarvinXin Jan ChenHrvoje Bogunovic
- Resource Type
- Edited book
- Publication Details
- Lecture notes in computer science, Vol.11039
- DOI
- 10.1007/978-3-030-00949-6
- ISBN
- 3030009491; 9783030009496
- Publisher
- Springer International Publishing; Cham
- Number of pages
- xvii, 347 pages
- Language
- English
- Date published
- 2018
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198019202771
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