Special Issue on INFORMS 2015 Annual Meeting: INFORMS 2015 Annual Meeting

Editorial

Yong Chen and Myong K Jeong

Quality and reliability engineering international, Vol.32(8), pp.2637-2638

12/2016

DOI: 10.1002/qre.2099

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Title: Subtitle: Special Issue on INFORMS 2015 Annual Meeting: INFORMS 2015 Annual Meeting
Creators: Yong Chen - University of Iowa
Myong K Jeong - Rutgers University–Newark
Resource Type: Editorial
Publication Details: Quality and reliability engineering international, Vol.32(8), pp.2637-2638
DOI: 10.1002/qre.2099
ISSN: 0748-8017
eISSN: 1099-1638
Language: English
Date published: 12/2016
Academic Unit: Industrial and Systems Engineering
Record Identifier: 9984186970502771

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