Logo image
On the use of linear sums, diagonal parity checking and two signatures in VLSI testing
Thesis   Open access

On the use of linear sums, diagonal parity checking and two signatures in VLSI testing

Chien-In Henry Chen
University of Iowa
Master of Science (MS), University of Iowa
Spring 1986
DOI: 10.25820/etd.008514
pdf
t1986_c518-o8.70 MBDownloadView
Open Access Free to read and download

Details

Metrics

14 File views/ downloads
2 Record Views
Logo image