Journal article
A DEMERITS CONTROL CHART FOR AUTOCORRELATED DATA
Quality engineering, Vol.13(2), pp.179-190
12/01/2000
DOI: 10.1080/08982110108918640
Abstract
Implementing traditional statistical process control techniques in situations where autocorrelation exists may increase the frequency of false alarms. In some cases, the assumption of uncorrelated process data is violated, thus resulting in inadequate monitoring and corrective actions for the process. We develop a new moving centerline demerits (MCD) control chart for monitoring process quality where there are multiple nonconformity severity levels and measurements tend to be autocorrelated. This is an extension of the traditional demerits control chart which assumes samples are independent. The MCD control chart is applied to actual data from injection-molding production lines. Results indicate that the MCD chart performs well with respect to signaling an out-of-control condition.
Details
- Title: Subtitle
- A DEMERITS CONTROL CHART FOR AUTOCORRELATED DATA
- Creators
- David A Nembhard - Department of Industrial Engineering , University of Wisconsin-MadisonHarriet Black Nembhard - Department of Industrial Engineering , University of Wisconsin-Madison
- Resource Type
- Journal article
- Publication Details
- Quality engineering, Vol.13(2), pp.179-190
- Publisher
- Taylor & Francis Group
- DOI
- 10.1080/08982110108918640
- ISSN
- 0898-2112
- eISSN
- 1532-4222
- Language
- English
- Date published
- 12/01/2000
- Academic Unit
- Business Analytics; Industrial and Systems Engineering; Engineering Administration
- Record Identifier
- 9984121967202771
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