A Note on Testing Logic Circuits by Transition Counting

Journal article

Peer reviewed

Sudhakar M Reddy

IEEE transactions on computers, Vol.C-26(3), pp.313-314

03/1977

DOI: 10.1109/TC.1977.1674831

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Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.

Single and multiple faults

transition count testing

Title: Subtitle: A Note on Testing Logic Circuits by Transition Counting
Creators: Sudhakar M Reddy - University of Iowa
Resource Type: Journal article
Publication Details: IEEE transactions on computers, Vol.C-26(3), pp.313-314
Publisher: IEEE
DOI: 10.1109/TC.1977.1674831
ISSN: 0018-9340
eISSN: 1557-9956
Language: English
Date published: 03/1977
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197160602771

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