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A testable design of iterative logic arrays
Journal article

A testable design of iterative logic arrays

R Parthasarathy and S Reddy
IEEE transactions on circuits and systems, Vol.28(11), pp.1037-1045
11/1981
DOI: 10.1109/TCS.1981.1084934

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Abstract

Circuit faults Circuit testing Electrical fault detection Fabrication Fault detection Fault diagnosis Logic arrays Logic design Logic testing Sufficient conditions

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