Journal article
An Efficient Diagnosis-Aware ATPG Procedure to Enhance Diagnosis Resolution and Test Compaction
IEEE transactions on very large scale integration (VLSI) systems, Vol.27(9), pp.2105-2118
09/2019
DOI: 10.1109/TVLSI.2019.2919233
Abstract
This paper proposes an efficient diagnosis-aware automatic test pattern generation (ATPG) procedure that can quickly identify equivalent-fault pairs and generate diagnosis patterns (DPs) for nonequivalent-fault pairs, where a (non)equivalent fault pair contains two stuck-at faults that are (non)equivalent. The proposed procedure contains three main methods, which together can efficiently generate highly compacted DPs by using a conventional ATPG tool. First, an all-pairs at-a-time diagnosis pattern generation (AFPAT-DPG) method, which adopts user-defined fault models (UDFMs), is employed to quickly generate DPs for most fault pairs that cannot be distinguished by a given set of, typically fault detection, test patterns (TP). For those fault pairs that cannot be distinguished by AFPAT-DPG, a multipair diagnostic ATPG method (MP-DATPG) is used. MP-DATPG is a complete method in the sense that it can generate diagnosis tests for every distinguishable pair of faults or prove that the pair of faults is indistinguishable. However, due to back-track limits in test generation procedures, diagnosis test generation for some fault pairs may be aborted after the application of the two methods. For such fault pairs, a subcircuit analysis (SCA) method is applied to identify equivalent fault pairs among the aborted fault pairs by trimming the circuit under consideration into one that is much easier to process within the back-track limits of the test generation procedures. Experimental results show that the proposed procedure is the first work that distinguishes 100% of all fault pairs in all ISCAS'89 and IWLS'05 benchmark circuits and over 99.99% for all ITC'99 benchmark circuits using a conventional ATPG tool that generates tests to detect faults.
Details
- Title: Subtitle
- An Efficient Diagnosis-Aware ATPG Procedure to Enhance Diagnosis Resolution and Test Compaction
- Creators
- Cheng-Hung Wu - Taiwan Semiconductor Manufacturing CompanyKuen-Jong Lee - National Cheng Kung UniversitySudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.27(9), pp.2105-2118
- Publisher
- IEEE
- DOI
- 10.1109/TVLSI.2019.2919233
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Grant note
- MOST 107-2218-E-006-025 / National Science Council of Taiwan Taiwan Semiconductor Manufacturing Corporation (TSMC)
- Language
- English
- Date published
- 09/2019
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197167702771
Metrics
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