Journal article
Application of homing sequences to synchronous sequential circuit testing
IEEE transactions on computers, Vol.43(5), pp.569-580
05/1994
DOI: 10.1109/12.280804
Abstract
A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure.< >
Details
- Title: Subtitle
- Application of homing sequences to synchronous sequential circuit testing
- Creators
- I Pomeranz - University of IowaS.M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on computers, Vol.43(5), pp.569-580
- Publisher
- IEEE
- DOI
- 10.1109/12.280804
- ISSN
- 0018-9340
- eISSN
- 1557-9956
- Language
- English
- Date published
- 05/1994
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197072102771
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