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Atomic force microscopy for the analysis of environmental particles
Journal article   Peer reviewed

Atomic force microscopy for the analysis of environmental particles

Kathryn A Ramirez-Aguilar, David W Lehmpuhl, Amy E Michel, John W Birks and Kathy L Rowlen
Ultramicroscopy, Vol.77(3), pp.187-194
1999
DOI: 10.1016/S0304-3991(99)00048-0

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Abstract

AFM Environmental particles TEM Tip–sample interactions

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