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Auger recombination in narrow-gap semiconductor superlattices incorporating antimony
Journal article   Open access   Peer reviewed

Auger recombination in narrow-gap semiconductor superlattices incorporating antimony

C H Grein, M E Flatte, J T Olesberg, S A Anson, L Zhang and T F Boggess
Journal of applied physics, Vol.92(12), pp.7311-7316
12/15/2002
DOI: 10.1063/1.1521255
url
https://doi.org/10.1063/1.1521255View
Published (Version of record) Open Access

Abstract

A comparison is performed between measured and calculated Auger recombination rates for four different narrow-gap superlattices based on the InAs/GaSb/AlSb material system. The structures are designed for optical or electrical injection for mid-infrared laser applications, with wavelengths ranging from 3.4 to 4.1 mum. The electronic band structures are computed employing an accurate 14-band restricted basis set (superlattice K.p) methodology that utilizes experimental information about the low-energy electronic structure of the bulk constituents. The superlattice band structures and their associated matrix elements are directly employed to compute Auger recombination rates. Varying amounts of Auger recombination suppression are displayed by the various superlattices as compared to bulk mid-infrared systems. The greatest disagreement between theory and experiment is shown for the structure predicted to have the most Auger suppression, suggesting the suppression is sensitive either to theoretical or growth uncertainties. (C) 2002 American Institute of Physics.
Physical Sciences Physics Physics, Applied Science & Technology

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