Journal article
Autoscan : A scan design without external scan inputs or outputs
IEEE transactions on very large scale integration (VLSI) systems, Vol.13(9), pp.1087-1095
2005
DOI: 10.1109/TVLSI.2005.857157
Abstract
We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under autoscan improve the circuit testability by allowing the circuit state to be modified through shifting. Due to the removal of the scan inputs and outputs, synthesis of scan chains under autoscan does not have to satisfy all the constraints imposed on conventional scan chains. We describe a synthesis procedure for autoscan chains, and demonstrate that autoscan allows us to detect almost all the faults that are detectable using conventional scan. We use random sequences in order to show that sequential test generation is not necessary under autoscan. We also describe a test generation procedure, and discuss the effect of autoscan on fault diagnosis. © 2005 IEEE.
Details
- Title: Subtitle
- Autoscan : A scan design without external scan inputs or outputs
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Journal article
- Publication Details
- IEEE transactions on very large scale integration (VLSI) systems, Vol.13(9), pp.1087-1095
- DOI
- 10.1109/TVLSI.2005.857157
- ISSN
- 1063-8210
- eISSN
- 1557-9999
- Publisher
- Institute of Electrical and Electronics Engineers
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197114002771
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